Radiative and non-radiative carrier lifetimes in InGaN-based light-emitting diodes investigated by impedance analysis
DC Field | Value | Language |
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dc.contributor.author | Kim, Young-Jin | - |
dc.contributor.author | Han, Dong-Pyo | - |
dc.contributor.author | Lee, Gyeong Won | - |
dc.contributor.author | Shin, Dong Soo | - |
dc.contributor.author | Shim, Jong In | - |
dc.date.accessioned | 2021-06-22T18:22:05Z | - |
dc.date.available | 2021-06-22T18:22:05Z | - |
dc.date.issued | 2016-01 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15985 | - |
dc.description.abstract | To investigate the efficiency droop in InGaN-based light-emitting diodes, we have measured the differential carrier lifetimes using the electrical method. After separating the radiative and non-radiative carrier lifetimes using the internal quantum efficiency, we discuss their implications. © 2015 IEEE. | - |
dc.format.extent | 2 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Radiative and non-radiative carrier lifetimes in InGaN-based light-emitting diodes investigated by impedance analysis | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1109/CLEOPR.2015.7375898 | - |
dc.identifier.scopusid | 2-s2.0-84962892970 | - |
dc.identifier.bibliographicCitation | 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v.1, pp 1 - 2 | - |
dc.citation.title | 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 | - |
dc.citation.volume | 1 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 2 | - |
dc.type.docType | Conference Paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Carrier lifetime | - |
dc.subject.keywordPlus | Efficiency | - |
dc.subject.keywordPlus | III-V semiconductors | - |
dc.subject.keywordPlus | Light | - |
dc.subject.keywordPlus | Differential carrier lifetimes | - |
dc.subject.keywordPlus | Efficiency droops | - |
dc.subject.keywordPlus | Electrical methods | - |
dc.subject.keywordPlus | Impedance analysis | - |
dc.subject.keywordPlus | Internal quantum efficiency | - |
dc.subject.keywordPlus | Non-radiative | - |
dc.subject.keywordPlus | Light emitting diodes | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/7375898 | - |
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