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Techniques for optoelectronic performance evaluation in InGaN-based light-emitting diodes (LEDs)
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shim, Jong In | - |
| dc.contributor.author | Shin, Dong Soo | - |
| dc.date.accessioned | 2021-06-22T18:22:17Z | - |
| dc.date.available | 2021-06-22T18:22:17Z | - |
| dc.date.issued | 2016-02 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15994 | - |
| dc.description.abstract | To understand how each experimental parameter influences optoelectronic performances of InGaN-based LEDs, a method of systematic analysis that assesses the interrelations independently and quantitatively is absolutely necessary. Here, we introduce various characterization techniques to clarify the performance of LEDs and hidden severity of the detrimental effects, starting from the simple I-V measurement to more sophisticated temperature-dependent, spectroscopic, and LED efficiency measurements. © 2015 The Japan Society of Applied Physics. | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Techniques for optoelectronic performance evaluation in InGaN-based light-emitting diodes (LEDs) | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/MOC.2015.7416402 | - |
| dc.identifier.scopusid | 2-s2.0-84969492251 | - |
| dc.identifier.wosid | 000380392500028 | - |
| dc.identifier.bibliographicCitation | MOC 2015 - Technical Digest of 20th Microoptics Conference, pp 1 - 2 | - |
| dc.citation.title | MOC 2015 - Technical Digest of 20th Microoptics Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | Capacitance | - |
| dc.subject.keywordPlus | Photoconductivity | - |
| dc.subject.keywordPlus | Power generation | - |
| dc.subject.keywordPlus | Semiconductor quantum wells | - |
| dc.subject.keywordPlus | Temperature measurement | - |
| dc.subject.keywordPlus | Voltage measurement | - |
| dc.subject.keywordPlus | Capacitance voltage characteristic | - |
| dc.subject.keywordPlus | Characterization techniques | - |
| dc.subject.keywordPlus | Experimental parameters | - |
| dc.subject.keywordPlus | I-V measurements | - |
| dc.subject.keywordPlus | LED efficiencies | - |
| dc.subject.keywordPlus | Quantum well device | - |
| dc.subject.keywordPlus | Systematic analysis | - |
| dc.subject.keywordPlus | Temperature dependent | - |
| dc.subject.keywordPlus | Light emitting diodes | - |
| dc.subject.keywordAuthor | Capacitance-voltage characteristics | - |
| dc.subject.keywordAuthor | Light emitting diodes | - |
| dc.subject.keywordAuthor | Photoconductivity | - |
| dc.subject.keywordAuthor | Power generation | - |
| dc.subject.keywordAuthor | Quantum well devices | - |
| dc.subject.keywordAuthor | Temperature measurement | - |
| dc.subject.keywordAuthor | Voltage measurement | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/7416402 | - |
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Related Researcher
- Shin, Dong Soo
- ERICA 첨단융합대학 (ERICA 반도체·디스플레이공학전공)