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Variation in series resistance under high device current in InGaN-based light-emitting diodes
- Authors
- 신동수
- Issue Date
- 29-Aug-2014
- Place
- Daegu, Korea
- Conference Name
- IMID 2014
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Related Researcher
- Shin, Dong Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)