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Quantifying the Risk Level of Functional Chips in DRAM Wafers
- Issue Date
- Nov-2015
- Publisher
- Institute of Electrical and Electronics Engineers
- Citation
- IEEE Intelligent Systems, v.30, no.6, pp 21 - 24
- Pages
- 4
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- IEEE Intelligent Systems
- Volume
- 30
- Number
- 6
- Start Page
- 21
- End Page
- 24
- ISSN
- 1541-1672
1941-1294
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Related Researcher
- Kim, Byunghoon
- ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)