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Quantifying the Risk Level of Functional Chips in DRAM Wafers
- Issue Date
- Nov-2015
- Publisher
- IEEE COMPUTER SOC
- Citation
- IEEE INTELLIGENT SYSTEMS, v.30, no.6, pp.21 - 24
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE INTELLIGENT SYSTEMS
- Volume
- 30
- Number
- 6
- Start Page
- 21
- End Page
- 24
- ISSN
- 1541-1672
- Files in This Item
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Related Researcher
- Kim, Byunghoon
- ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)