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A Graphical Model to Diagnose Product Defects with Partially Shuffled Equipment Data

Authors
Ahn, GilseungHur, SunShin, DongminPark, You-Jin
Issue Date
Dec-2019
Publisher
MDPI
Keywords
partially shuffled time series; graphical model; equipment data analysis; defect diagnosis; multi-source data fusion
Citation
PROCESSES, v.7, no.12, pp 1 - 13
Pages
13
Indexed
SCIE
SCOPUS
Journal Title
PROCESSES
Volume
7
Number
12
Start Page
1
End Page
13
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/2013
DOI
10.3390/pr7120934
ISSN
2227-9717
2227-9717
Abstract
The diagnosis of product defects is an important task in manufacturing, and machine learning-based approaches have attracted interest from both the industry and academia. A high-quality dataset is necessary to develop a machine learning model, but the manufacturing industry faces several data-collection issues including partially shuffled data, which arises when a product ID is not perfectly inferred and yields an unstable machine learning model. This paper introduces latent variables to formulate a supervised learning model that addresses the problem of partially shuffled data. The experimental results show that our graphical model deals with the shuffling of product order and can detect a defective product far more effectively than a model that ignores shuffling.
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COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING > 1. Journal Articles

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ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)
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