Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Charge trapping in indium zinc oxide thin film transistors with active channel fabricated by two-step deposition method
- Authors
- 박진석
- Issue Date
- 25-Apr-2012
- Place
- San Diego, USA
- Conference Name
- International Conference on Metallurgical Coatings & Thin Films
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- PARK, JIN SEOK
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)