Influence of carrier overflow on the forward-voltage characteristics of InGaN-based light-emitting diodes
- Authors
- Han, Dong-Pyo; Kim, Hyunsung; Shim, Jong-In; Shin, Dong-Soo; Kim, Kyu-Sang
- Issue Date
- Nov-2014
- Publisher
- American Institute of Physics
- Citation
- Applied Physics Letters, v.105, no.19, pp.1 - 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- Applied Physics Letters
- Volume
- 105
- Number
- 19
- Start Page
- 1
- End Page
- 5
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/21146
- DOI
- 10.1063/1.4902023
- ISSN
- 0003-6951
- Abstract
- We investigate the influence of carrier overflow on the forward-voltage characteristics of the InGaN-based blue light-emitting-diode (LED) by comparing the temperature-dependent characteristics of the electroluminescence (EL) efficiency, the EL spectra, and the current-voltage relation over a wide range of temperature (50-300 K). Based on these experimental results, we demonstrate that the simple ohmic potential drop in the Shockley diode equation is not sufficient to explain the experimental data when the severe carrier overflow to the p-(Al)GaN layer induces the efficiency droop in the LED device. The anomalous relation between current and voltage at cryogenic temperatures is explained by the space-charge-limited current formed by the overflown electrons, rather than by the increase of a constant series resistance in the p-(Al) GaN layer. (C) 2014 AIP Publishing LLC.
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