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Comparative Measurements of Internal Electric Field Intensity in InGaN/GaN Multiple Quantum Wells by Photocurrent and Electroreflectance spectroscopy
- Authors
- 심종인
- Issue Date
- 24-May-2011
- Place
- Toba, Mie, Japan
- Conference Name
- APWS-2011
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Related Researcher
- Shim, Jong In
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)