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IEEE 1149.7 인터페이스를 이용한 차량용 칩 고장 진단 기술
- Authors
- 박성주
- Issue Date
- May-2014
- Publisher
- 대한전자공학회
- Citation
- 대한전자공학회 SoC 학술대회, pp.1 - 2
- Indexed
- OTHER
- Journal Title
- 대한전자공학회 SoC 학술대회
- Start Page
- 1
- End Page
- 2
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- There are no files associated with this item.
- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 1. Journal Articles
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