A novel transmission line characterisation based on measurement data reconfirmation
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Dongchul | - |
dc.contributor.author | Kim, Hyewon | - |
dc.contributor.author | Eo, Yungseon | - |
dc.date.accessioned | 2021-06-22T23:43:27Z | - |
dc.date.available | 2021-06-22T23:43:27Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2014-04 | - |
dc.identifier.issn | 0020-7217 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/23277 | - |
dc.description.abstract | Due to inherent resonance effects and frequency-variant dielectric properties, it is very difficult to experimentally determine the stable and accurate circuit model parameters of thin film transmission line structures over a broad frequency band. In this article, a new, simple and straightforward frequency-variant transmission line circuit model parameter determination method is presented. Experimental test patterns for high-frequency transmission line characterisations are designed and fabricated using a package process. The S-parameters for the test patterns are measured using a vector network analyzer (VNA) from 100MHz to 26.5GHz. The parasitic effects due to contact pads are de-embedded. The frequency-variant complex permittivity and resonance-effect-free transmission line parameters (i.e., the propagation constant and characteristic impedance) are then determined in a broad frequency band. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | TAYLOR & FRANCIS LTD | - |
dc.title | A novel transmission line characterisation based on measurement data reconfirmation | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Eo, Yungseon | - |
dc.identifier.doi | 10.1080/00207217.2013.785032 | - |
dc.identifier.scopusid | 2-s2.0-84896778363 | - |
dc.identifier.wosid | 000332271200005 | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF ELECTRONICS, v.101, no.4, pp.479 - 491 | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF ELECTRONICS | - |
dc.citation.title | INTERNATIONAL JOURNAL OF ELECTRONICS | - |
dc.citation.volume | 101 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 479 | - |
dc.citation.endPage | 491 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.subject.keywordAuthor | complex permittivity | - |
dc.subject.keywordAuthor | RLGC | - |
dc.subject.keywordAuthor | interconnect | - |
dc.subject.keywordAuthor | transmission line | - |
dc.subject.keywordAuthor | S-parameters | - |
dc.identifier.url | https://www.tandfonline.com/doi/full/10.1080/00207217.2013.785032 | - |
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