A novel transmission line characterisation based on measurement data reconfirmation
- Authors
- Kim, Dongchul; Kim, Hyewon; Eo, Yungseon
- Issue Date
- Apr-2014
- Publisher
- TAYLOR & FRANCIS LTD
- Keywords
- complex permittivity; RLGC; interconnect; transmission line; S-parameters
- Citation
- INTERNATIONAL JOURNAL OF ELECTRONICS, v.101, no.4, pp.479 - 491
- Indexed
- SCIE
SCOPUS
- Journal Title
- INTERNATIONAL JOURNAL OF ELECTRONICS
- Volume
- 101
- Number
- 4
- Start Page
- 479
- End Page
- 491
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/23277
- DOI
- 10.1080/00207217.2013.785032
- ISSN
- 0020-7217
- Abstract
- Due to inherent resonance effects and frequency-variant dielectric properties, it is very difficult to experimentally determine the stable and accurate circuit model parameters of thin film transmission line structures over a broad frequency band. In this article, a new, simple and straightforward frequency-variant transmission line circuit model parameter determination method is presented. Experimental test patterns for high-frequency transmission line characterisations are designed and fabricated using a package process. The S-parameters for the test patterns are measured using a vector network analyzer (VNA) from 100MHz to 26.5GHz. The parasitic effects due to contact pads are de-embedded. The frequency-variant complex permittivity and resonance-effect-free transmission line parameters (i.e., the propagation constant and characteristic impedance) are then determined in a broad frequency band.
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles
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