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Nanoparticle Removal with Megasonics: A Review

Authors
Brems,S.Hauptmann,M.Camerotto, E.Pacco,A.KIM, TAE GONXu,X.Wostyn,K.Mertens,P.De Gendt,S.
Issue Date
Jan-2014
Publisher
ELECTROCHEMICAL SOC INC
Citation
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.3, no.1, pp.N3010 - N3015
Indexed
SCIE
SCOPUS
Journal Title
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
Volume
3
Number
1
Start Page
N3010
End Page
N3015
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/24098
DOI
10.1149/2.004401jss
ISSN
2162-8769
Abstract
Nanoparticle removal obtained without inflicting damage to fragile device elements remains a big challenge. The feasibility of physical cleans is assessed and boundary conditions are outlined. An overview of megasonic cleaning process improvements is given. In order to reduce damage without reducing particle removal frequencies during high frequency ultrasound cleaning processes, cavitation needs to be better controlled. This is partly achieved by (1) using pulsed acoustic fields which makes it possible to control the average bubble size and, at the same time, maximize the number of resonant bubbles, by (2) increasing the dissolved gas concentration and lowering the surface tension which facilitates bubble formation and, finally, by (3) introducing traveling waves to transport bubbles to the surface which needs to be cleaned.
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ERICA 공학대학 (MAJOR IN APPLIED MATERIAL & COMPONENTS)
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