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Analysis of recombination mechanisms in InGaN-based light-emitting diodes from electrical and optical characterizations

Authors
Shin, Dong Soo
Issue Date
Nov-2014
Publisher
ACP
Citation
Asia Communications and Photonics Conference, ACP, v.2014-November, pp.1 - 3
Indexed
SCOPUS
Journal Title
Asia Communications and Photonics Conference, ACP
Volume
2014-November
Start Page
1
End Page
3
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/25850
ISSN
2162-108X
Abstract
Various techniques that can give useful information on the nonradiative recombination mechanisms in InGaN-based light-emitting diodes are discussed. Characterization techniques range from the simple current-voltage and light-current measurements to more sophisticated temperature-dependent methods. © OSA 2014
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles

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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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