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The Effect of Fluid pH for 2-Body Lapping Process

Authors
Kim, Hyuk-MinSeo, Young-GilPark, Jin-Goo
Issue Date
Nov-2014
Publisher
IEEE
Citation
2014 INTERNATIONAL CONFERENCE ON PLANARIZATION/CMP TECHNOLOGY (ICPT), pp.317 - 320
Indexed
SCIE
SCOPUS
Journal Title
2014 INTERNATIONAL CONFERENCE ON PLANARIZATION/CMP TECHNOLOGY (ICPT)
Start Page
317
End Page
320
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/25870
DOI
10.1109/ICPT.2014.7017309
Abstract
Glass ceramics is one of the key materials for the optoelectronic devices. Lapping is a critical technology which controls the thickness and flatness of the substrate. The modified lapping process using the fixed diamond abrasive pad with DIW (De-ionized water) was evaluated and suggested in the previous our study to replace the conventional process which has problems in terms of environment and CoO (Cost of Ownership). In this study, the effect of DIW pH on the glass lapping process was investigated fundamentally. It was found that the removal behavior of for SiO2 materials as the function of fluid pH was different compared to the reported literatures.
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Park, Jin Goo
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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