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Experimental characterisations of thin film transmission line losses
- Issue Date
- Aug-2013
- Publisher
- INST ENGINEERING TECHNOLOGY-IET
- Citation
- ELECTRONICS LETTERS, v.49, no.17, pp 1084 - 1085
- Pages
- 2
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- ELECTRONICS LETTERS
- Volume
- 49
- Number
- 17
- Start Page
- 1084
- End Page
- 1085
- ISSN
- 0013-5194
1350-911X
- Abstract
- New frequency-variant losses of planar thin film transmission lines are experimentally investigated in a broad frequency range. The frequency-variant transmission line parameters are accurately determined in the measured frequency band (i.e. from 40 MHz to 50 GHz). Then, it is shown that there are three critical frequencies that characterise the loss mechanism of thin film transmission lines. The conventional skin-effect model is not accurate in thin and fine transmission lines.
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Related Researcher
- EO, YUNG SEON
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)