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Polarization errors associated with reflective objectives in a micro-spot spectroscopic ellipsometer

Authors
Park, SungmoAn, Ilsin
Issue Date
May-2019
Publisher
IOP PUBLISHING LTD
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, v.58, no.5
Indexed
SCIE
SCOPUS
Journal Title
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume
58
Number
5
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/2952
DOI
10.7567/1347-4065/ab1646
ISSN
0021-4922
Abstract
A micro-spot spectroscopic ellipsometer covering 1.5-4.8 eV is developed using two infinity-corrected reflective objectives. Only a small portion of the entrance pupil in the objective is used to obtain a similar to 50 mu m x 70 mu m spot on a sample. However, non-normal reflections inside the objectives cause experimental errors (up to 2.3 degrees in Delta) when they are arranged symmetrically about a sample. In this paper, we show how to diagnose the polarization errors associated with the reflective objectives and how to deal with them. (C) 2019 The Japan Society of Applied Physics
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles

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