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Droop Studies for High-Performance InGaN Blue Light-Emitting Diodes

Authors
Shim, Jong-InKim, HyunsungHan, Dong-PyoShin, Dong-Soo
Issue Date
Jun-2013
Publisher
IEEE
Keywords
Photonics and Electrooptics; Light emitting diodes; Radiative recombination; Charge carrier density; Electroluminescence; Shape
Citation
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR), pp.1 - 2
Indexed
OTHER
Journal Title
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR)
Start Page
1
End Page
2
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/30937
DOI
10.1109/CLEOPR.2013.6600207
Abstract
An origin of the efficiency droop has been suggested as the saturation of the radiative recombination rate in InGaN quantum well at low current and subsequent increase in the nonradiative recombination rates at high current.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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