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데이터 변환용 집적회로의 고장발생 요인 분석.

Authors
노정진
Issue Date
21-May-2003
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/31302
Place
르네상스호텔 4층.
Conference Name
신뢰성분석연구센터 Workshop
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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Roh, Jeong jin
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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