Single wavelength rotating analyzer ellipsometry for line-width control

안일신

Detailed Information

Cited 0 time in webofscience

Cited 0 time in scopus

Metadata Downloads

Single wavelength rotating analyzer ellipsometry for line-width control

Authors: 안일신

Issue Date: 25-Oct-2002

Publisher: 한국물리학회

Citation: 추계한국물리학회학술대회

URI: https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/31734

Conference Name: 추계한국물리학회학술대회

Place: 한양대학교

Files in This Item: There are no files associated with this item.

Appears in Collections: COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 2. Conference Papers

Show full item record

qrcode

Altmetrics

Total Views & Downloads

STATISTICS: Total View :2,647,415; Today View :1,382

RSS_1.0 RSS_2.0 ATOM_1.0

55 Hanyangdeahak-ro, Sangnok-gu, Ansan, Gyeonggi-do, 15588, Korea+82-31-400-4269 sweetbrain@hanyang.ac.kr

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Detailed Information

Altmetrics

Total Views & Downloads

BROWSE