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다층 배선에서 차폐효과 모델 및 스위칭에 미치는 영향
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 어영선 | - |
| dc.date.accessioned | 2021-06-23T08:12:28Z | - |
| dc.date.available | 2021-06-23T08:12:28Z | - |
| dc.date.issued | 1998-11-21 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/34204 | - |
| dc.description.abstract | New capacitance modeling and transient analysis for multi-layer interconnects with shielding effect are presented. The upper layer capacitances with under-layer shielding lines are represented by introducing a filling factor which can be defined as the ratio of upper-layer line length to the total under-layer line width. | - |
| dc.title | 다층 배선에서 차폐효과 모델 및 스위칭에 미치는 영향 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 대한전자공학회 추계 학술대회 | - |
| dc.citation.conferencePlace | 경북대 | - |
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Related Researcher
- EO, YUNG SEON
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)