Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Structural and ferroelectric properties of P(VDF-TrFE) thin films depending on the annealing temperature
- Authors
- Seo, Jeongdae; Son, Jong Yeog; Kim, Woo-Hee
- Issue Date
- Mar-2019
- Publisher
- Elsevier BV
- Keywords
- P(VDF-TrFE) thin film; Piezoelectricity; Ferroelectricity; Crystallization temperature; Needle-like structure
- Citation
- Materials Letters, v.238, pp.294 - 297
- Indexed
- SCIE
SCOPUS
- Journal Title
- Materials Letters
- Volume
- 238
- Start Page
- 294
- End Page
- 297
- ISSN
- 0167-577X
- Abstract
- Organic P(VDF-TrFE) 70/30 copolymer thin films were prepared on ITO/glass substrates at 110-150 degrees C by spin coating. All the P(VDF-TrFE) thin films exhibited ferroelectric beta-phase crystallinity in X-ray diffraction analysis. The polarization-electric field hysteresis analysis revealed that the P(VDF-TrFE) thin film annealed at 140 degrees C has superior ferroelectric properties with a high remanent polarization of 8.02 mu C/cm(2). From atomic force microscopic characterization, we observed lamellar and needle-like structures in the P(VDF-TrFE) thin film annealed at 140 degrees C. Further, piezoelectric force microscopic measurements confirmed a much higher piezoelectric property of the P(VDF-TrFE) thin film annealed at 140 degrees C than those of the films annealed at other temperatures. (C) 2018 Elsevier B.V. All rights reserved.
- Files in This Item
- Go to Link
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Woo Hee
- ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)