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비트라인을 이용한 메모리 셀 간의 연결 고장 테스트하기 위한 반도체회로 및 그 테스트 방법
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- 백상현[백상현]
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 4. Patents
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- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)