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Active efficiency as an effective quality indicator for the active layer of light-emitting diodes
- Authors
- 신동수
- Issue Date
- 14-Nov-2019
- Place
- Okinawa, Japan
- Conference Name
- The 9th Asia-Pacific Workshop on Widegap Semiconductors
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Related Researcher
- Shin, Dong Soo
- ERICA 첨단융합대학 (ERICA 반도체·디스플레이공학전공)