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TAM 기반의 병렬 코어 스캔 테스트를 위한 설계 기술Design technique for concurrent core testing based on Test Access Mechanism(TAM)
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- Design technique for concurrent core testing based on Test Access Mechanism(TAM)
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- 박성주[박성주]
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Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents
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