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Transmission electron microscopy analysis of octanethiol-coated Cu powders
- Authors
- Lee, Tae Hun; Yoo, Jung Ho; Hyun, Moon Seop; Yang, Jun-Mo; Kwon, Jinhyeong; Lee, Caroline Sunyong; Park, Jucheol; Baik, Kyeong Ho
- Issue Date
- Apr-2011
- Publisher
- OXFORD UNIV PRESS
- Keywords
- Cu powder; octanethiol; field-emission transmission electron microscope; high-resolution transmission electron microscopy; electron energy loss spectroscopy
- Citation
- JOURNAL OF ELECTRON MICROSCOPY, v.60, no.2, pp 143 - 148
- Pages
- 6
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- JOURNAL OF ELECTRON MICROSCOPY
- Volume
- 60
- Number
- 2
- Start Page
- 143
- End Page
- 148
- ISSN
- 0022-0744
1477-9986
- Abstract
- In this study, microstructures of Cu powders coated with octanethiol were analyzed using (scanning) transmission electron microscopy. Moreover, aging process of the octanethiol-coated layer as time passes by was analyzed using the electron energy loss spectroscopy technique. The octanethiol layer coated on the surface of Cu powders was kept until it was exposed to air for around 30 days. As days passes by, the coating layer had been decomposed and then a Cu(2)O layer was formed on the surface of powders.
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Related Researcher
- Lee, Sunyong Caroline
- ERICA 첨단융합대학 (ERICA 신소재·반도체공학전공)