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Current-voltage characteristics of InGaN/GaN blue light-emitting diodes investigated by photovoltaic parameters

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dc.contributor.authorOh, Chan-Hyoung-
dc.contributor.authorShim, Jong-In-
dc.contributor.authorShin, Dong-Soo-
dc.date.accessioned2021-06-22T10:40:56Z-
dc.date.available2021-06-22T10:40:56Z-
dc.date.created2021-01-21-
dc.date.issued2019-01-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/3914-
dc.description.abstractWe investigate the current-voltage (I-V) characteristics of InGaN/GaN multiple-quantum-well blue light-emitting diodes (LEDs) to analyze the additional voltage drop outside the active region. We theoretically examine and measure the short-circuit current versus the open-circuit voltage (I-SC-V-OC) obtained by photoexcitation and compare them with the I-V obtained by electrical injection. The I-SC-V-OC curve shows the ideal I-V characteristics that do not contain the deviation from the exponential behavior. In the ideality factor obtained by differentiating the I-SC-V-OC curve, the increase of ideality factor due to the series resistance is not observed. The slope of the additional voltage drop Delta V versus current curve shows a nonlinear behavior, indicating that a simple ohmic voltage drop is not sufficient to explain Delta V. From these observations, it is concluded that the carrier recombination in the active region plays a non-negligible role in I-V characteristics of LEDs deviating from the ideal behavior. (C) 2018 The Japan Society of Applied Physics-
dc.language영어-
dc.language.isoen-
dc.publisherIOP Publishing Ltd-
dc.titleCurrent-voltage characteristics of InGaN/GaN blue light-emitting diodes investigated by photovoltaic parameters-
dc.typeArticle-
dc.contributor.affiliatedAuthorShim, Jong-In-
dc.contributor.affiliatedAuthorShin, Dong-Soo-
dc.identifier.doi10.7567/1347-4065/aae92f-
dc.identifier.scopusid2-s2.0-85059856883-
dc.identifier.wosid000450635900005-
dc.identifier.bibliographicCitationJapanese Journal of Applied Physics, v.58, no.1, pp.1 - 6-
dc.relation.isPartOfJapanese Journal of Applied Physics-
dc.citation.titleJapanese Journal of Applied Physics-
dc.citation.volume58-
dc.citation.number1-
dc.citation.startPage1-
dc.citation.endPage6-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusElectric resistance-
dc.subject.keywordPlusGallium compounds-
dc.subject.keywordPlusIII-V semiconductors-
dc.subject.keywordPlusIndium compounds-
dc.subject.keywordPlusLight emitting diodes-
dc.subject.keywordPlusOpen circuit voltage-
dc.subject.keywordPlusSemiconductor quantum wells-
dc.identifier.urlhttps://iopscience.iop.org/article/10.7567/1347-4065/aae92f-
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