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Reduction in high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping

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dc.contributor.authorLee, S. B.-
dc.contributor.authorKim, A.-
dc.contributor.authorLee, J. S.-
dc.contributor.authorChang, S. H.-
dc.contributor.authorYoo, H. K.-
dc.contributor.authorNoh, T. W.-
dc.contributor.authorKahng, B.-
dc.contributor.authorLee, M-J.-
dc.contributor.authorKim, C. J.-
dc.contributor.authorKang, B. S.-
dc.date.accessioned2021-06-23T12:42:08Z-
dc.date.available2021-06-23T12:42:08Z-
dc.date.issued2010-08-
dc.identifier.issn0003-6951-
dc.identifier.issn1077-3118-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39582-
dc.description.abstractThe high reset current, I-R, in unipolar resistance switching is an important issue which should be resolved for practical applications in nonvolatile memories. We showed that, during the forming and set processes, the compliance current, I-comp, can work as a crucial parameter to reduce I-R. Doping with Co or Mn can significantly reduce the leakage current in capacitors made using SrTiOx film, opening a larger operation window for I-comp. By decreasing I-Comp with acceptor doping, we could reduce I-R in SrTiOx films by a factor of approximately 20. Our work suggests that the decrease in I-comp by carrier doping could be a viable alternative for reducing I-R in unipolar resistance switching. (C) 2010 American Institute of Physics. [doi:10.1063/1.3486460]-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER INST PHYSICS-
dc.titleReduction in high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1063/1.3486460-
dc.identifier.scopusid2-s2.0-77956378519-
dc.identifier.wosid000282187200071-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.97, no.9, pp 1 - 4-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume97-
dc.citation.number9-
dc.citation.startPage1-
dc.citation.endPage4-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusLEAKAGE CURRENT-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordPlusMODEL-
dc.subject.keywordAuthorTHIN-FILMS-
dc.subject.keywordAuthorMEMORY-
dc.subject.keywordAuthorMODEL-
dc.subject.keywordAuthorLEAKAGE CURRENT-
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.3486460-
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