Reduction in high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping
DC Field | Value | Language |
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dc.contributor.author | Lee, S. B. | - |
dc.contributor.author | Kim, A. | - |
dc.contributor.author | Lee, J. S. | - |
dc.contributor.author | Chang, S. H. | - |
dc.contributor.author | Yoo, H. K. | - |
dc.contributor.author | Noh, T. W. | - |
dc.contributor.author | Kahng, B. | - |
dc.contributor.author | Lee, M-J. | - |
dc.contributor.author | Kim, C. J. | - |
dc.contributor.author | Kang, B. S. | - |
dc.date.accessioned | 2021-06-23T12:42:08Z | - |
dc.date.available | 2021-06-23T12:42:08Z | - |
dc.date.issued | 2010-08 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.issn | 1077-3118 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39582 | - |
dc.description.abstract | The high reset current, I-R, in unipolar resistance switching is an important issue which should be resolved for practical applications in nonvolatile memories. We showed that, during the forming and set processes, the compliance current, I-comp, can work as a crucial parameter to reduce I-R. Doping with Co or Mn can significantly reduce the leakage current in capacitors made using SrTiOx film, opening a larger operation window for I-comp. By decreasing I-Comp with acceptor doping, we could reduce I-R in SrTiOx films by a factor of approximately 20. Our work suggests that the decrease in I-comp by carrier doping could be a viable alternative for reducing I-R in unipolar resistance switching. (C) 2010 American Institute of Physics. [doi:10.1063/1.3486460] | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Reduction in high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1063/1.3486460 | - |
dc.identifier.scopusid | 2-s2.0-77956378519 | - |
dc.identifier.wosid | 000282187200071 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.97, no.9, pp 1 - 4 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 97 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 4 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | LEAKAGE CURRENT | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | MEMORY | - |
dc.subject.keywordPlus | MODEL | - |
dc.subject.keywordAuthor | THIN-FILMS | - |
dc.subject.keywordAuthor | MEMORY | - |
dc.subject.keywordAuthor | MODEL | - |
dc.subject.keywordAuthor | LEAKAGE CURRENT | - |
dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.3486460 | - |
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