Reduction in high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping
- Authors
- Lee, S. B.; Kim, A.; Lee, J. S.; Chang, S. H.; Yoo, H. K.; Noh, T. W.; Kahng, B.; Lee, M-J.; Kim, C. J.; Kang, B. S.
- Issue Date
- Aug-2010
- Publisher
- AMER INST PHYSICS
- Keywords
- THIN-FILMS; MEMORY; MODEL; LEAKAGE CURRENT
- Citation
- APPLIED PHYSICS LETTERS, v.97, no.9, pp 1 - 4
- Pages
- 4
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 97
- Number
- 9
- Start Page
- 1
- End Page
- 4
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39582
- DOI
- 10.1063/1.3486460
- ISSN
- 0003-6951
1077-3118
- Abstract
- The high reset current, I-R, in unipolar resistance switching is an important issue which should be resolved for practical applications in nonvolatile memories. We showed that, during the forming and set processes, the compliance current, I-comp, can work as a crucial parameter to reduce I-R. Doping with Co or Mn can significantly reduce the leakage current in capacitors made using SrTiOx film, opening a larger operation window for I-comp. By decreasing I-Comp with acceptor doping, we could reduce I-R in SrTiOx films by a factor of approximately 20. Our work suggests that the decrease in I-comp by carrier doping could be a viable alternative for reducing I-R in unipolar resistance switching. (C) 2010 American Institute of Physics. [doi:10.1063/1.3486460]
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