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Ni-catalyzed growth of silicon wire arrays for a Schottky diode

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dc.contributor.authorJee, Sang-Won-
dc.contributor.authorKim, Joondong-
dc.contributor.authorJung, Jin-Young-
dc.contributor.authorUm, Han-Don-
dc.contributor.authorMoiz, Syed Abdul-
dc.contributor.authorYoo, Bongyoung-
dc.contributor.authorCho, Hyung Koun-
dc.contributor.authorPark, Yun Chang-
dc.contributor.authorLee, Jung-Ho-
dc.date.accessioned2021-06-23T13:02:46Z-
dc.date.available2021-06-23T13:02:46Z-
dc.date.created2021-01-21-
dc.date.issued2010-07-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39630-
dc.description.abstractVertically grown Si wire arrays were fabricated on a large scale by the Ni-catalyzed vapor-liquid-solid method. A single Si wire has a length of several tens of micrometers with a pure Si stem and a NiSi2 tip. The NiSi2 tip was spontaneously formed on a Si wire due to a slight lattice mismatch relative to Si. Further, this system provides a Schottky contact having a rectifying ratio of similar to 10(2) with a low leakage current of about 2.88 x 10(-10) A. The growth mechanism of vertical Si wires and the performance of a Schottky diode are discussed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3467839]-
dc.language영어-
dc.language.isoen-
dc.publisherAmerican Institute of Physics-
dc.titleNi-catalyzed growth of silicon wire arrays for a Schottky diode-
dc.typeArticle-
dc.contributor.affiliatedAuthorYoo, Bongyoung-
dc.contributor.affiliatedAuthorLee, Jung-Ho-
dc.identifier.doi10.1063/1.3467839-
dc.identifier.scopusid2-s2.0-77955758520-
dc.identifier.wosid000281059200042-
dc.identifier.bibliographicCitationApplied Physics Letters, v.97, no.4, pp.1 - 3-
dc.relation.isPartOfApplied Physics Letters-
dc.citation.titleApplied Physics Letters-
dc.citation.volume97-
dc.citation.number4-
dc.citation.startPage1-
dc.citation.endPage3-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusRECOMBINATION PROPERTIES-
dc.subject.keywordPlusNICKEL-
dc.subject.keywordPlusNANOWIRE-
dc.subject.keywordPlusGOLD-
dc.subject.keywordAuthorarrays-
dc.subject.keywordAuthorcatalysis-
dc.subject.keywordAuthorelemental semiconductors-
dc.subject.keywordAuthorleakage currents-
dc.subject.keywordAuthornickel-
dc.subject.keywordAuthorrectification-
dc.subject.keywordAuthorSchottky barriers-
dc.subject.keywordAuthorSchottky diodes-
dc.subject.keywordAuthorsemiconductor growth-
dc.subject.keywordAuthorsilicon-
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.3467839-
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