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Mechanism of Embedded Micro/Nano Channel Formation for a Negative-tone Photoresist by Moving Mask Lithography

Authors
Kim, Sang-KonOh, Hye-KeunJung, Young-DaeAn, Ilsin
Issue Date
Mar-2010
Publisher
KOREAN PHYSICAL SOC
Keywords
Lithography; Lithography simulation; Negative resist; Chemically amplified resist; Multi-exposures; Inverse lithography; Embedded fluidic channels; MEMS
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.56, no.3, pp.851 - 855
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
56
Number
3
Start Page
851
End Page
855
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39948
DOI
10.3938/jkps.56.851
ISSN
0374-4884
Abstract
Photoresist lithography has been applied in MEMS (micro electro mechanical systems). A flexible 3D (three-dimensional) micro/nano fabrication technique and its process simulation tool are required for 3D MEMS. This paper presents an UV (ultraviolet) lithography process simulation for the formation of an embedded micro/nano fluidic channel in a negative-tone photoresist. For this purpose, the moving-mask technology is modeled. The simulation algorithm of the nanolithography is applied for the micro-lithography. The validity of the simulation for the proposed 3D microstructuring is successfully confirmed by a, comparison between the experimental and the simulated results. Hence, modeling and simulation for the formation of various patterns of micro/nano fluidic channels in a negative-tone photoresist can be used to provide the photoresist characteristics and to optimize the lithography process conditions.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF APPLIED PHYSICS > 1. Journal Articles

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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)
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