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Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling

Authors
Baeg, Sanghyeon
Issue Date
Aug-2009
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Capacitor; differential signaling; fault; pattern-dependent jitter (PDJ); test buffer
Citation
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.58, no.8, pp 2544 - 2556
Pages
13
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume
58
Number
8
Start Page
2544
End Page
2556
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/41004
DOI
10.1109/TIM.2009.2014624
ISSN
0018-9456
1557-9662
Abstract
This paper presents a novel method for detecting defective ac-coupling capacitors in high-speed differential signaling connections by designing a circuit with null detectors at the differential receiver. The design parameters of selecting the null ranges in the receiver buffer are proposed to efficiently detect the voltage droop that creates erroneous jitter. The null detectors in the proposed method enable the use of a lower test signal speed than the mission data rate at differential connections to detect defective capacitors. The proposed design method of null detectors combines four design and test factors, namely, regular null, voltage doubling, fail-safe, and defect sensitization, to determine the stretched null used for test purposes. The null-detection scheme has been implemented and verified in the design using a regular current-mode logic (CML) differential buffer in the 0.18-mu m complementary metal-oxide-semiconductor (CMOS) process. The detection capability of the proposed method to check for traditional defects with the same null detector is also demonstrated through SPICE-based fault simulations. The proposed method is also verified with the board developed for parameter measurements. The parameters proposed in this paper showed excellent agreement among calculated, simulated, and measured values. In particular, measured parameters showed strong closeness up to 99% to its calculated values.
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Baeg, Sanghyeon
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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