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Effect of O-2 Pretreatment on Fluorinated Carbon Film Surfaces

Authors
Seong, Mi RynLee, Gye YoungCho, Si HyeongLim, Hyun WooPark, Jin GooLee, Caroline Sunyong
Issue Date
Feb-2009
Publisher
Japan Institute of Metals
Keywords
fluorinated carbon (FC) film; O-2 pretreatment; X-ray photoelectron spectroscope (XPS); atomic force microscope (AFM)
Citation
Materials Transactions, v.50, no.2, pp 332 - 334
Pages
3
Indexed
SCIE
SCOPUS
Journal Title
Materials Transactions
Volume
50
Number
2
Start Page
332
End Page
334
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/41415
DOI
10.2320/matertrans.MRA2008295
ISSN
1345-9678
1347-5320
Abstract
Fluorocarbon (FC) film is used in micro-electro-mechanical system (MEMS) processes as an anti-stiction layer. We studied the effect of O-2 pretreatment on FC film using an X-ray photoelectron spectroscope (XPS) and atomic force microscope (AFM) to measure the surface roughness and to characterize the composition of the film. CF and CF3 were observed for all temperatures at 6.67 Pa. A high oxygen concentration was found in the film deposited at 250 degrees C. An AFM analysis of the surface roughness showed agglomeration on the film surface, while none was found on the films deposited at 25 degrees C and 100 degrees C. Therefore, the O-2 pretreatment seemed to facilitate oxidation at a deposition temperature of 250 degrees C. Since our results showed that a smooth anti-stiction layer could be deposited at 100 degrees C without any oxidation occurring, the optimum conditions for FC deposition were 100 degrees C at a pressure of 6.67 Pa. Therefore, this study showed an important relationship between O-2 pretreatment and deposition temperature. [doi: 10.2320/matertrans.MRA2008295]
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ERICA 첨단융합대학 (ERICA 신소재·반도체공학전공)
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