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Data retention characteristics of Bi3.25La0.75Ti3O12 thin films on conductive SrRuO3 electrodes
- Authors
- Lee, Jang-Sik; Kang, B. S.; Jia, Q. X.
- Issue Date
- Oct-2007
- Publisher
- AMER INST PHYSICS
- Keywords
- HYDROGEN-INDUCED DEGRADATION; POLARIZATION RETENTION; CAPACITORS; NANOSCALE; MEMORIES; TITANATE; CRYSTAL; IRO2
- Citation
- APPLIED PHYSICS LETTERS, v.91, no.14, pp.1 - 4
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 91
- Number
- 14
- Start Page
- 1
- End Page
- 4
- ISSN
- 0003-6951
- Abstract
- Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films were deposited on SrRuO3 (SRO) and Pt electrodes by pulsed laser deposition. The data retention characteristics of the BLT films on different electrode materials were characterized. The experimental results are well fitted by a stretched exponential decay model, indicating that BLT films on both Pt and SRO exhibit the similar decay mechanisms. However, the decay behavior is quite different due to the use of different bottom electrodes. The superior data retention performance of BLT film on conductive SRO electrode is believed to be from the reduction of domain polarization backswitching originated from the oxygen vacancies in the depletion region of BLT films. (c) 2007 American Institute of Physics.
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Related Researcher
- Kang, Bo Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)