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Electrode dependence of resistance switching in NiO thin films
- Authors
- 김동욱; 신동수; 장서형; 박배호; Jung, Ranju; Li, X. S.; Kim, Dong-Chirl; 이장원; Seo, S.
- Issue Date
- Oct-2007
- Publisher
- 한국물리학회
- Keywords
- resistance switching; NiO; current-voltage measurement
- Citation
- Journal of the Korean Physical Society, v.51, no.II, pp 88 - 91
- Pages
- 4
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- Journal of the Korean Physical Society
- Volume
- 51
- Number
- II
- Start Page
- 88
- End Page
- 91
- ISSN
- 0374-4884
1976-8524
- Abstract
- We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, An and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-voltage (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures axe nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.
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Related Researcher
- Shin, Dong Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)