Predicting mixed-signal dynamic performance using optimised signature-based alternate test

Abstract

Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships between signatures and specification. In addition, it is difficult to precisely control physical factors in built-in self-test circuitry, which can cause errors in the signatures. A methodology for efficient prediction of circuit specifications with optimised signatures has been proposed. The proposed optimised signature-based alternate test methodology accurately predicts the specifications of a Device Under Test (DUT) using a strong correlation mapping function. Hardware measurement results show that this approach can be effectively used to predict the specifications of a DUT, with a significant reduction in the prediction error compared with previous approaches.