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Dynamics of Positive Charge Trapping in a-IGZO TFTs under NBIS Using Microsecond PulsedLight Illumination
- Authors
- 오새룬터
- Issue Date
- 20190828
- Place
- 경주 HICO
- Conference Name
- International Meeting on Information Display (IMID)
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Related Researcher
- OH, SAE ROON TER
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)