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An efficient link controller for test access to IP core-based embedded system chips
- Authors
- Song, Jaehoon; Yi, Hyunbean; Han, Juhee; Park, Sungju
- Issue Date
- Aug-2007
- Publisher
- Springer
- Keywords
- Boundary scan; Embedded system; SoC testing; Test access Mechanism; Wrapper
- Citation
- Advances in Computer Systems Architecture 12th Asia-Pacific Conference, ACSAC 2007, Seoul, Korea, August 23-25, 2007, Proceedings, pp 139 - 150
- Pages
- 12
- Indexed
- SCIE
SCOPUS
- Journal Title
- Advances in Computer Systems Architecture 12th Asia-Pacific Conference, ACSAC 2007, Seoul, Korea, August 23-25, 2007, Proceedings
- Start Page
- 139
- End Page
- 150
- Abstract
- It becomes crucial to test and verify embedded hardware systems precisely and efficiently. For an embedded System-on-a-Chip (SoC) comprised of multiple IP cores, various design techniques have been proposed to provide diverse test access link configurations. In this paper, a Flag-based Wrapped Core Link Controller (FWCLC) is introduced to enable efficient accessibility to embedded cores as well as seamless integration of IEEE 1149.1 TAP'd cores and IEEE 1500 wrapped cores. Compared with other state-of-the-art techniques, our technique requires no modification on each core, less area overhead, and provides more diverse link configurations for design-for-debug as well as design-for-test. © Springer-Verlag Berlin Heidelberg 2007.
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