Hybrid test data compression technique for low-power scan test data
- Authors
- Song, Jaehoon; Lee, Junseop; Kim, Byeongjin; Jung, Taejin; Yi, Hyunbean; Park, Sungju
- Issue Date
- Nov-2007
- Publisher
- IEEE
- Citation
- Proceedings - 2007 International Symposium on Information Technology Convergence, ISITC 2007, pp 152 - 156
- Pages
- 5
- Indexed
- SCOPUS
- Journal Title
- Proceedings - 2007 International Symposium on Information Technology Convergence, ISITC 2007
- Start Page
- 152
- End Page
- 156
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44369
- DOI
- 10.1109/ISITC.2007.11
- Abstract
- The large test data volume and power consumption are major problems in testing System-on-a-Chip (SoC) which is a key component of today's embedded system. To reduce the test application time from an Automatic Test Equipment (ATE), a new test data compression technique is proposed in this paper. Don 't-cares in a pre-computed test cube set are assigned to reduce the test power consumption. Then, fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or technique. Finally, test set converted is compressed to reduce test application time. © 2007 IEEE.
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