Efficient interconnect test patterns for crosstalk and static faults
- Authors
- Min, Pyoungwoo; Yi, Hyunbean; Song, Jaehoon; Baeg, Sanghyeon; Park, Sungju
- Issue Date
- Nov-2006
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- crosstalk faults; interconnect test; static faults; system-on-chip (SoC)
- Citation
- IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, v.25, no.11, pp.2605 - 2608
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
- Volume
- 25
- Number
- 11
- Start Page
- 2605
- End Page
- 2608
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44568
- DOI
- 10.1109/TCAD.2006.873899
- ISSN
- 0278-0070
- Abstract
- This paper introduces effective test patterns for system-on-chip and board interconnects. Initially, "6n" patterns are introduced to completely detect and diagnose both static and crosstalk faults, where "n" is the total number of interconnect nets. Then, more economic "4n+1" patterns are described to test the crosstalk faults for the interconnect nets separated within a certain distance.
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- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 1. Journal Articles
- COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles
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