고진공에서 이온 카운터를 사용한 실시간 입자모니터링 시스템의 개발
- Authors
- 안강호; 김용민; 윤진욱; 권용택
- Issue Date
- May-2006
- Publisher
- 한국반도체및디스플레이장비학회
- Citation
- 한국반도체 및 디스플레이장비학회 2006년도 춘계학술대회 논문집, pp 255 - 258
- Pages
- 4
- Indexed
- OTHER
- Journal Title
- 한국반도체 및 디스플레이장비학회 2006년도 춘계학술대회 논문집
- Start Page
- 255
- End Page
- 258
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44903
- Abstract
- In this paper, the new method which is monitoring quantity of particles using by ion-counter has been developed. ISPM system is composed by Gerdien type ion-counter (house-made), DC power supply and electrometer. Ion-counter applied positive voltage could detect only positive charged particles. Therefore charged particles to Boltzmann equilibrium distribution or to some identified charge distribution can be detected by ion-counter. Ion-counter could install on the exhaust line of process equipment since pressure loss is structurally low. ISPM system has been certified by comparison with the result of SMPS (Scanning Mobility Particle Sizer) system. The relation coefficiency is above 0.98 about 20∼300nm 20∼300nm particles with identified charge distribution under 0.1∼10.0 0.1∼10.0 Torr.
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Collections - COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF MECHANICAL ENGINEERING > 1. Journal Articles

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