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Polarization dynamics and retention loss in fatigued PbZr0.4Ti0.6O3 ferroelectric capacitors

Authors
Kang, BSYoon, JGNoh, TWSong, TKSeo, SLee, YKLee, JK
Issue Date
Jan-2003
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.82, no.2, pp.248 - 250
Indexed
SCIE
SCOPUS
Journal Title
APPLIED PHYSICS LETTERS
Volume
82
Number
2
Start Page
248
End Page
250
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46728
DOI
10.1063/1.1534411
ISSN
0003-6951
Abstract
Short-time retention loss behaviors were investigated for fatigued Pt/PbZr0.4Ti0.6O3/Pt capacitors. In the short-time regime of t<1 s, fatigued capacitors showed a significant loss in retained polarization, which could be well described by a power-law function. This behavior was interpreted in terms of a superposition of polarization relaxations with a relaxation time distribution. The effects of the pulse voltage on the relaxation time distribution suggested that the retention loss should be activated by a depolarization field. As the fatigue stress was applied, the retention loss became worse. This effect can be explained in terms of the increase of the depolarization field, possibly due to the growth of an interfacial passive layer. (C) 2003 American Institute of Physics.
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