Dynamical aspects of retention and its relation to fatigue in ferroelectric thin films
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, BS | - |
dc.contributor.author | Yoon, JG | - |
dc.contributor.author | Song, TK | - |
dc.contributor.author | Seo, S | - |
dc.contributor.author | So, YW | - |
dc.contributor.author | Noh, TW | - |
dc.date.accessioned | 2021-06-24T00:46:00Z | - |
dc.date.available | 2021-06-24T00:46:00Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2002-11 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46776 | - |
dc.description.abstract | Short-time retention loss behaviors were investigated for fatigued Pt/PbZr0.4Ti0.6O3/Pt capacitors. In the short-time regime of t < 1 s, fatigued capacitors showed a significant loss in retained polarization. The short-time retention loss behavior was well described by a power-law function and the retention characteristic got worse as the fatigue stress increased. The retention loss was analyzed in a viewpoint of polarization dynamics, superpositions of Debye-type polarization relaxations. Distribution of the relaxation time was affected by the degree of fatigue stress and write/read pulse-field strength. The results were explained in terms of the depolarization field. [DOI: 10.1143/JJAP.41.6836] | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.title | Dynamical aspects of retention and its relation to fatigue in ferroelectric thin films | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kang, BS | - |
dc.identifier.doi | 10.1143/JJAP.41.6836 | - |
dc.identifier.scopusid | 2-s2.0-32444445353 | - |
dc.identifier.wosid | 000182730300049 | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.41, no.11B, pp.6836 - 6839 | - |
dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.citation.volume | 41 | - |
dc.citation.number | 11B | - |
dc.citation.startPage | 6836 | - |
dc.citation.endPage | 6839 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | POLARIZATION | - |
dc.subject.keywordPlus | CAPACITORS | - |
dc.subject.keywordAuthor | ferroelectric | - |
dc.subject.keywordAuthor | thin film | - |
dc.subject.keywordAuthor | memory | - |
dc.subject.keywordAuthor | retention | - |
dc.subject.keywordAuthor | PZT | - |
dc.subject.keywordAuthor | depolarization | - |
dc.subject.keywordAuthor | relaxation | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.41.6836 | - |
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