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Analysis on Mechanical-Strain Induced Bias-Stress Instabilities for the Flexible InGaZnO Thin Film Transistors with Different Channel Geometries
- Authors
- 오새룬터
- Issue Date
- 20190705
- Place
- Kyoto, Japan
- Conference Name
- 26th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)
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