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Negative Capacitance Phenomenon Depending On The Wake-up Effect And The Measurement Temperature In The Ferroelectric Si:HfO2 Films
- Authors
- 강보수
- Issue Date
- 6-Aug-2018
- Place
- Nara hotel, Nara, Japan
- Conference Name
- 12th Japan-Korea Conference on Ferroelectrics
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Related Researcher
- Kang, Bo Soo
- ERICA 첨단융합대학 (ERICA 지능정보양자공학전공)