Jang, Jun Tae; Yu, Hye Ri; Ahn, Geumho; Choi, Sung-Jin; Kim, Dong Myong; Kim, Yong-Sung; Oh, Saeroonter; Baeck, Ju Heyuck; Bae, Jong Uk; Park, Kwon-Shik, et al.
ArticleIssue Date2018CitationDigest of Technical Papers - SID International Symposium, v.49, no.1, pp 232 - 235PublisherJohn Wiley and Sons Inc