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Hf-Al-Zn-O 기반의 투명 박막 트랜지스터의 NBIS 안정성 분석NBIS stability of Hf-Al-Zn-O based transparent thin film transistors
- Other Titles
- NBIS stability of Hf-Al-Zn-O based transparent thin film transistors
- Issue Date
- Jul-2017
- Publisher
- 대한전기학회
- Citation
- 2017년도 대한전기학회 하계학술대회 논문집, pp.1143 - 1144
- Indexed
- OTHER
- Journal Title
- 2017년도 대한전기학회 하계학술대회 논문집
- Start Page
- 1143
- End Page
- 1144
- Files in This Item
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Related Researcher
- PARK, JIN SEOK
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)