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Analysis of carrier recombination dynamics in InGaN-based light-emitting diodes by differential carrier lifetime measurement

Authors
Han, Dong-PyoShim, Jong-InShin, Dong-Soo
Issue Date
May-2017
Publisher
Japan Soc of Applied Physics
Citation
Applied Physics Express, v.10, no.5, pp.1 - 5
Indexed
SCIE
SCOPUS
Journal Title
Applied Physics Express
Volume
10
Number
5
Start Page
1
End Page
5
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/9643
DOI
10.7567/APEX.10.052101
ISSN
1882-0778
Abstract
In this work, we investigate the carrier recombination dynamics in InGaN-based blue LED devices by analyzing the radiative and nonradiative carrier lifetimes as functions of driving current. To separate the radiative and nonradiative carrier lifetimes, we utilize the information on the internal quantum efficiency (IQE) and differential carrier lifetime. For comparative analysis, the characteristics of the IQE and electroluminescence spectrum are also used. Through measurements and analyses, we demonstrate that the saturation of the radiative recombination rate induced by the phase-space filling in the active volume triggers the increase in nonradiative recombination rate, thus leading to the efficiency droop. (C) 2017 The Japan Society of Applied Physics
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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