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Analysis of SiGe Heterojunction Tunneling Field-Effect Transistor in the Microwave Regime Through Its Small-Signal Equivalent Circuit

Authors
Jung, Y.H.Kang, I.M.Cho, S.
Issue Date
2018
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Progress in Electromagnetics Research Symposium, v.2018-August, pp.2550 - 2553
Journal Title
Progress in Electromagnetics Research Symposium
Volume
2018-August
Start Page
2550
End Page
2553
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/4418
DOI
10.23919/PIERS.2018.8598056
ISSN
1559-9450
Abstract
In this study, Si 1-x Ge x is used as the source junction material in a tunneling field-effect transistor (TFET)and the device is analyzed in the perspectives of radio-frequency (RF)performances. Using the small-signal equivalent circuit with high accuracy in the RF domain, the errors in capacitances and transconductances have been effectively suppressed below 11 % at 600 GHz. © 2018 The Institute of Electronics, Information and Communication Engineers (IEICE).
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