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Effect of moving speed during in-line pulsed direct-current magnetron sputtering deposition on the structural and optical properties of Al-doped ZnO films

Authors
Kim, Sung YongCho, Eou-SikKwon, Sang Jik
Issue Date
30-Sep-2017
Publisher
ELSEVIER SCIENCE SA
Keywords
AZO thin films; In-line sputtering; Pulsed-DC sputtering; Scan speed; Figure of merit (FOM)
Citation
THIN SOLID FILMS, v.638, pp.144 - 152
Journal Title
THIN SOLID FILMS
Volume
638
Start Page
144
End Page
152
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/5690
DOI
10.1016/j.tsf.2017.07.014
ISSN
0040-6090
Abstract
Aluminum-doped zinc oxide (AZO) films were deposited on glass substrates with pulsed direct current (DC) magnetron sputtering. Deposition was carried out in both static and dynamic modes. The pulsed DC sputtering process provided a stable deposition of AZO films without arcing, resulting in good crystallinity, unlike simple DC magnetron sputtering. The growth characteristics of the films sputtered on various moving speeds of the in-line dynamic mode are investigated and compared to those of the static mode. AZO films deposited at a moving speed of 120 cm/min showed a dominant (002) orientation, a smooth surface roughness, and a higher figure of merit (FOM), of which properties are similar to those of the static mode. Comparisons of the characteristics obtained at several moving speeds showed that better crystallinity was obtained at the higher moving speed of 120 cm/min. This improvement could be attributed to an averaging effect, which is due to more frequent interruption and initiation of the growth at the higher moving speed. Optical transmission characteristics were compared between the static and dynamic modes, and analyzed in terms of the complex indices of refraction and interference effects of light. (C) 2017 Elsevier B.V. All tights reserved.
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Cho, Eou Sik
반도체대학 (반도체·전자공학부)
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